Open AccessPolished sample preparing and backscattered electron imaging and of fly ash-cement paste
Author(s) -
ShiJin Feng,
Yanqi Li
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/322/2/022060
Subject(s) - materials science , sample (material) , cement , electron , flatness (cosmology) , optics , weathering , scanning electron microscope , composite material , geology , chemistry , physics , cosmology , chromatography , quantum mechanics , geomorphology