
Application of an improved threshold segmentation method in SEM material analysis
Author(s) -
Denghui Li,
Yanhong Wang
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/322/2/022057
Subject(s) - segmentation , image segmentation , artificial intelligence , pattern recognition (psychology) , image (mathematics) , computer science , threshold model , computer vision , algorithm , machine learning