Open AccessA new life for the wavelength-dispersive X-ray spectrometer (WDS): incorporation of a silicon drift detector into the WDS for improved quantification and X-ray mapping
Author(s) -
Richard Wuhrer,
Ken Moran
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/304/1/012021
Subject(s) - detector , anode , spectrometer , wavelength , electron microprobe , optics , silicon drift detector , x ray , physics , volumetric flow rate , noise (video) , materials science , analytical chemistry (journal) , chemistry , electrode , chromatography , quantum mechanics , artificial intelligence , computer science , metallurgy , image (mathematics)