Open AccessMeasurement of backscatter factor for kilovoltage x-ray beam using ionization chamber and Gafchromic XR-QA2 film
Author(s) -
Nor Shazleen Ab Shukor,
Nahriful Asri,
Siti Mariam Ja’afar,
Muhammad Syazwan Rosnan,
Siti Aishah Abdul Aziz
Publication year - 2018
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/298/1/012043
Subject(s) - backscatter (email) , materials science , beam (structure) , ionization chamber , optics , calibration , x ray , ionization , physics , ion , telecommunications , quantum mechanics , computer science , wireless