Open AccessA smart technique for attendance system to recognize faces through parallelism
Author(s) -
B Prabhavathi,
V. Tanuja,
V. Madhu Viswanatham,
M Rajashekhara Babu
Publication year - 2017
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/263/4/042095
Subject(s) - computer science , attendance , face (sociological concept) , histogram , exploit , facial recognition system , artificial intelligence , image (mathematics) , image processing , noise (video) , face detection , computer vision , pattern recognition (psychology) , computer security , social science , sociology , economics , economic growth