Reflection electron energy loss spectroscopy of structures based on silicon and transition metals | Zendy

А. С. Паршин | Zendy; A. Yu. Igumenov | Zendy; Yu. L. Mikhlin | Zendy; O. P. Pchelyakov | Zendy; В. С. Жигалов | Zendy

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Reflection electron energy loss spectroscopy of structures based on silicon and transition metals

Author(s) -

А. С. Паршин,

A. Yu. Igumenov,

Yu. L. Mikhlin,

O. P. Pchelyakov,

В. С. Жигалов

Publication year - 2017

Publication title -

iop conference series materials science and engineering

Language(s) - English

Resource type - Journals

eISSN - 1757-899X

pISSN - 1757-8981

DOI - 10.1088/1757-899x/255/1/012019

Subject(s) - electron energy loss spectroscopy , inelastic scattering , spectroscopy , atomic physics , materials science , scattering , plasmon , electron spectroscopy , spectral line , silicon , reflection (computer programming) , electron , electron excitation , analytical chemistry (journal) , chemistry , optics , transmission electron microscopy , physics , metallurgy , optoelectronics , nanotechnology , chromatography , quantum mechanics , astronomy , computer science , programming language

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