Open AccessImproved model for detection of homogeneous production batches of electronic components
Author(s) -
Lev Kazakovtsev,
В. И. Орлов,
Dmitry Stashkov,
А. Н. Антамошкин,
И С Масич
Publication year - 2017
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/255/1/012004
Subject(s) - homogeneity (statistics) , homogeneous , electronic component , electronics , reliability (semiconductor) , production (economics) , electronic equipment , reliability engineering , computer science , electronic systems , electronic control unit , quality (philosophy) , process engineering , automotive engineering , engineering , electronic engineering , electrical engineering , mathematics , computer hardware , power (physics) , philosophy , physics , epistemology , combinatorics , quantum mechanics , machine learning , economics , macroeconomics