Open AccessCombined mode I stress intensity factors of slanted cracks
Author(s) -
Al Emran Ismail,
Mumtahina Rahman,
Mohd Zubir Mohd Ghazali,
Md. Mahbubur Rahim,
Mustaffa Ibrahim,
Mohd Fahrul Hassan,
Nik Hisyamudin Muhd Nor,
Arihasnida Ariffin,
Muhamad Zaini Yunos
Publication year - 2017
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/226/1/012011
Subject(s) - stress intensity factor , extrapolation , tension (geology) , bending moment , finite element method , bending , materials science , geometry , structural engineering , mathematics , mathematical analysis , composite material , engineering , ultimate tensile strength
The solutions of stress intensity factors (SIFs) for slanted cracks in plain strain plate are hard to find in open literature. There are some previous solutions of SIFs available, however the studies are not completed except for the case of plain stress. The slanted cracks are modelled numerically using ANSYS finite element program. There are ten slanted angles and seven relative crack depths are used and the plate contains cracks which is assumed to fulfil the plain strain condition. The plate is then stressed under tension and bending loading and the SIFs are determined according to the displacement extrapolation method. Based on the numerical analysis, both slanted angles and relative crack length, a/L played an important role in determining the modes I and II SIFs. As expected the SIFs increased when a/L is increased. Under tension force, the introduction of slanted angles increased the SIFs. Further increment of angles reduced the SIFs however they are still higher than the SIFs obtained using normal cracks. Under bending moment, the present of slanted angles are significantly reduced the SIFs compared with the normal cracks. Under similar loading, mode II SIFs increased as function of a/L and slanted angles where increasing such parameters increasing the mode II SIFs.