Open AccessStudy of dielectric properties of adulterated milk concentration and freshness
Author(s) -
V Jitendra Murthy,
N Sai Kiranmai,
Sanjeev Kumar
Publication year - 2017
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/225/1/012285
Subject(s) - dielectric , loss factor , materials science , conductivity , dielectric loss , pasteurization , raw milk , chemistry , food science , optoelectronics