Open AccessPCB Fault Detection Using Image Processing
Author(s) -
Jithendra P R Nayak,
K. Anitha,
B. D. Parameshachari,
Reshma Banu,
P Rashmi
Publication year - 2017
Publication title -
iop conference series. materials science and engineering
Language(s) - Uncategorized
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/225/1/012244
Subject(s) - printed circuit board , process (computing) , etching (microfabrication) , automated optical inspection , fault (geology) , computer science , fabrication , engineering , engineering drawing , layer (electronics) , materials science , electrical engineering , nanotechnology , medicine , alternative medicine , pathology , seismology , geology , operating system