Open AccessPreparation and structural, dielectric characterization of CaBSi2O6 (B = Mg, Co, Ni, Mn, Zn) ceramics
Author(s) -
Tony Joseph,
K. Anlin Lazar,
D. Divya
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1166/1/012025
Subject(s) - ceramic , materials science , dielectric , microstructure , scanning electron microscope , analytical chemistry (journal) , permittivity , diffraction , characterization (materials science) , microwave , mineralogy , relative permittivity , thermal expansion , phase (matter) , dielectric loss , composite material , optics , nanotechnology , optoelectronics , chemistry , physics , organic chemistry , chromatography , quantum mechanics
Silicates have received much attention because of their low relative permittivity and low dielectric loss properties for their applications in microwave and millimetre frequency region. This paper reports the preparation and structural, dielectric characterization of CaB Si 2 O 6 ceramics. The ceramics are prepared by the conventional solid state ceramic route. X-ray diffraction studies were conducted to identify the phase formation of CaBSi 2 O 6 ceramics. A scanning electron microscope was employed to observe the microstructure of the polished surfaces of the ceramics. The dielectric properties of the ceramics were measured at 1 MHz as well as at 8-12 GHz. The thermal expansion coefficient of the ceramics is also studied.