Open AccessScanning electron microscopy as a useful tool for the analysis of non-conductive materials
Author(s) -
Iveta Tichá,
Ludmila Kučerová
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1161/1/012005
Subject(s) - scanning electron microscope , microstructure , materials science , porosity , energy dispersive x ray spectroscopy , carbon fibers , composite material , electrical conductor , chemical composition , chemistry , composite number , organic chemistry
Scanning electron microscopy (SEM) in the analysis of non-conductive samples became one of the most important methods for the investigation of material properties. In this work, we used SEM microstructure analysis for the investigation of the origin of cracks in granite composites and also, we tested the porosity inside the regenerated carbon biowaste, potentially used as a clean source of carbon for the future applications in materials production. Additionally, the morphology and the chemical composition of small particles used for the moulding processes of plastics were also tested. The importance of the microstructure investigation was supported by Energy-Dispersive X-ray Spectroscopy (EDS) often used for the chemical composition evaluation of these non-conductive materials.