Open AccessQuantification of low concentration elements using soft X-rays at high spatial resolution
Author(s) -
P. Pinard,
S. Richter
Publication year - 2016
Publication title -
iop conference series materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/109/1/012013
Subject(s) - image resolution , resolution (logic) , electron probe microanalysis , microanalysis , acceleration voltage , high resolution , materials science , electron , voltage , cathode ray , computer science , optics , analytical chemistry (journal) , computational physics , physics , chemistry , remote sensing , geology , nuclear physics , scanning electron microscope , artificial intelligence , environmental chemistry , quantum mechanics , organic chemistry
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