Open AccessImpact of post annealing on the electrical properties of silver nanofilms
Author(s) -
Shiva. L. Udachan,
N. H. Ayachit,
L. A. Udachan,
Shivakumar Siddanna,
S. Kolkundi,
S. Ramya
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1056/1/012003
Subject(s) - annealing (glass) , electrical resistivity and conductivity , vacuum evaporation , materials science , electrical resistance and conductance , nanostructure , nanotechnology , composite material , thermal , metallurgy , thin film , electrical engineering , thermodynamics , engineering , physics
This paper reports on the growth of nanostructures of silver films prepared by thermal evaporation in vacuum. We focused on the effect of annealing on the silver films’ electrical properties. The resistance of the sample was measured by the standard four-probe technique. The electrical resistivity data pertaining to the impact of annealing was analyzed with the help of Fuchs-Sondheimer (F-S) and Mayadas-Shatzkes (M-S) theories.