
Fourier-transform infrared spectroscopy for analysis of diamond materials of different origin
Author(s) -
T. V. Martynova,
Н. И. Полушин,
А. И. Лаптев,
A L Maslov,
Mariya Stanislavovna Shitareva,
А. Н. Кириченко
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1047/1/012187
Subject(s) - diamond , impurity , materials science , crystallite , fourier transform infrared spectroscopy , material properties of diamond , spectroscopy , diamond type , synthetic diamond , crystal (programming language) , analytical chemistry (journal) , thermal conductivity , optics , composite material , chemistry , metallurgy , organic chemistry , computer science , physics , quantum mechanics , programming language
The study of impurity composition of diamond materials is an important element of their classification for use in various fields of science and technology. Many physical (thermal and electrical conductivity, optical purity), mechanical (hardness and strength) and aesthetic (color grade and clarity) properties of diamond depend on the presence of impurities in their structure; therefore, it is important to quickly and reliably determine each impurity in diamond. In this work, the method of FTIR spectroscopy is proposed as an express method for determining the impurity composition of diamonds. We examined three types of diamond materials: single crystal natural diamonds (before and after heat treatment), single crystal synthetic HPHT-diamonds and synthetic polycrystalline diamond CVD-films. We have established that the used technique allows to determine impurities in single crystals of natural and synthetic origin reliably and effectively, while the study of polycrystalline thin films is best performed using spectrophotometry.