Open AccessDevelopment of reliability testing device for grating encoder
Author(s) -
Xinda Zhou,
Chuan-Hai Chen,
Hailong Tian,
Haiji Yang,
Shizheng Li
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1043/5/052004
Subject(s) - reliability (semiconductor) , encoder , modular design , computer science , fixture , fault (geology) , grating , frame (networking) , interface (matter) , rotary encoder , reliability engineering , engineering , materials science , mechanical engineering , telecommunications , power (physics) , physics , parallel computing , geology , operating system , optoelectronics , bubble , quantum mechanics , maximum bubble pressure method , seismology
The technical index of a reliability testing device for grating encoder is determined based on the analysis of the working condition and fault cause of the grating encoder, and the overall scheme of the test device is designed. The support and mechanical structures of the operation fixture and loading device and the monitoring system of the test device are designed based on a modular design. The upper computer software is developed using LabVIEW, and the programming frame and the control interface are introduced. Reliability test is performed to verify the feasibility of the reliability testing device, and the degradation path of the predetermined degradation index is obtained.