Open AccessStorage Failure Mechanism Analysis and Reliability Improvement Measures for Electromagnetic Relay
Author(s) -
Zhaobin Wang,
Weiyan Li,
Kangning Chen,
Zhen Li,
Shang Shang
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1043/4/042058
Subject(s) - relay , reliability (semiconductor) , reliability engineering , degradation (telecommunications) , mechanism (biology) , computer science , failure mechanism , failure mode and effects analysis , engineering , structural engineering , power (physics) , telecommunications , physics , quantum mechanics
In order to solve the problem of unknown cause of parameter degradation and incomplete failure mechanism, and to obtain the data support required for the storage life evaluation of the whole machine system, a certain type of electromagnetic relay was selected for accelerated storage degradation test. The failure mode, the law and mechanism of electrical parameter change under storage condition were studied. On this basis, the improvement measures of relay reliability are put forward, which is of certain significance to improve the reliability of electromagnetic relay and system.