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Extraction and utilization of satellite products life and reliability data on orbit
Author(s) -
Xinqi Lv,
Jingyan Wang,
Nan Du
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1043/4/042030
Subject(s) - reliability (semiconductor) , orbit (dynamics) , reliability engineering , satellite , computer science , aerospace engineering , engineering , power (physics) , physics , quantum mechanics
Based on the analysis and carding of the reliability and life parameters of satellites, the paper sorted out the on orbit reliability features of various types of satellite products according to the basic concept of reliability. Further, the paper put forward the basic method of reliability feature extraction based on satellite telemetry data. On this basis, the on orbit reliability database of satellite products is designed, which effectively realizes the classified storage and management application of on orbit reliability related information, and provides support for the following on orbit reliability data on orbit life prediction, reliability evaluation and other aspects of utilization.

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