Open AccessReliability evaluation method of LED lighting matrix considering degradation and catastrophic failure
Author(s) -
Changchao Gu,
Lexiao Li,
Nanxin Ye,
Hao Chang
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1043/4/042006
Subject(s) - reliability engineering , degradation (telecommunications) , reliability (semiconductor) , catastrophic failure , fault tree analysis , computer science , matrix (chemical analysis) , engineering , materials science , composite material , telecommunications , power (physics) , physics , quantum mechanics
Aiming at the current situation of degradation and catastrophic failure of weaponry, a reliability modelling method considering performance degradation (lumen degradation) and catastrophic failure (nonluminous) is proposed with LED lighting matrix as the research object. First, for the degradation of lumen, the failure mechanism analysis is carried out, the thermal resistance model of lighting matrix and radiator is established, and the overall model of the degradation of the LED lighting matrix is realized. For the catastrophic failure, based on the uncertainty of the logic relationship of catastrophic failure of lighting matrix and the polymorphism of individual fault events, the method of combining fault tree and Bayesian network is used to realize the analysis of failure evolution and reliability modelling. Finally, the validity of the proposed method is verified with a case study.