Open AccessAn incipient consistency identification scheme of failure mechanism based on improved grey theory
Author(s) -
X. R. Ye,
Yuqing Hu,
Shuang Si,
Ruan Feng,
S. R. Liu,
Guofu Zhai
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1043/3/032018
Subject(s) - consistency (knowledge bases) , reliability (semiconductor) , identification (biology) , reliability engineering , dimension (graph theory) , computer science , failure causes , residual , mathematics , power (physics) , algorithm , engineering , artificial intelligence , physics , botany , quantum mechanics , pure mathematics , biology
Accelerated degradation test (ADT) is an effective technique to quantitatively evaluate the life characteristics of high-reliability and long-life products. And the consistency of failure mechanism under different accelerated stress levels is the premise of ADT. In order to identify the consistency of failure mechanism as early as possible and improve the identification accuracy, an incipient consistency identification method of failure mechanism based on improved grey theory is proposed in this paper. Firstly, we reconstruct the background value through the calculation of the integral in the interval. Then the new information priority principle is introduced to improve the construction of initial values in the conventional grey theory. Subsequently, combined with the equal dimension model, the integrated scheme is employed to analyze the enhancement testing data of a resistor in a switching power supply to identify the mutation point of failure mechanism. Compared with the conventional GM (1,1) model, the proposed method has smaller residual, and another identification based on degradation model is also constructed to verify the feasibility and creditability of the proposed method.