Open AccessStudy on the Reduced Reliability of A Certain Amplifier Caused by Electrostatic Discharge (ESD)
Author(s) -
Guangcan Zhu,
Jing Lan,
Diliang Li,
Yugang Qian,
Tian-Mi Zhou,
Yuying Hu
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1043/3/032005
Subject(s) - tripping , reliability (semiconductor) , amplifier , electromagnetic shielding , electrical engineering , electrostatic discharge , reliability engineering , engineering , voltage , computer science , physics , circuit breaker , power (physics) , cmos , quantum mechanics
This paper introduces and analyzes the single-channel tripping accident of a reactor as a result of false triggering of a certain amplifier caused by electrostatic discharge (ESD). In response to this problem, a simulated operational amplifier circuit platform is built in practice to verify the analysis results, and a solution is proposed at last. In addition, further analysis is made to the existing preventive maintenance plans, and cable shielding is found to be problematic; therefore, the principle and analysis of cable shielding are given here.