Open AccessRemaining Useful Life Prediction of r-out-of-n: G System
Author(s) -
Qian Zhao,
Zhenghao Song,
Ping Jiang,
Fengchen Qian,
J W Zhang
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1043/2/022046
Subject(s) - weibull distribution , reliability (semiconductor) , reliability engineering , computer science , mathematics , algorithm , statistics , engineering , physics , power (physics) , quantum mechanics
Remaining useful life (RUL) prediction has been gradually concerned in reliability engineering. In addition, r -out-of- n : G system is one of the most typical systems. Therefore, it is meaningful and significant to predict the RUL of r -out-of- n : G system with high precision. Motivated by this problem, relationship between the reliability and the RUL is discussed in this paper. Further, on the assumption that the components are independently exponentially or Weibull distributed, the closed-forms for RUL of r -out-of- n : G system are derived, respectively. For components following more complex distributions, a simulation method has also been provided. The numerical examples prove that the proposed method is rather accurate and efficient, and it is worth learning in engineering practice.