
Electrical Characterization of Diamond/Boron Doped Diamond Nanostructures for Use in Harsh Environment Applications
Author(s) -
Łukasz Gołuński,
Krzysztof Zwolski,
P. Płotka
Publication year - 2016
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/104/1/012022
Subject(s) - diamond , materials science , chemical vapor deposition , doping , material properties of diamond , wafer , boron , nanotechnology , scanning electron microscope , ohmic contact , carbon film , thin film , optoelectronics , composite material , chemistry , layer (electronics) , organic chemistry