Open AccessThe structure and the electrical properties of a multilayer system based on a composite (Co40Fe40B20)34(SiO2) and zinc oxide
Author(s) -
О. В. Жилова,
А. В. Ситников,
S. Yu. Pankov,
В. А. Макагонов,
М. А. Каширин,
Ірина Володимирівна Бабкіна
Publication year - 2021
Publication title -
iop conference series. materials science and engineering
Language(s) - English
Resource type - Journals
eISSN - 1757-899X
pISSN - 1757-8981
DOI - 10.1088/1757-899x/1035/1/012013
Subject(s) - materials science , transmission electron microscopy , amorphous solid , crystallization , composite number , sputtering , analytical chemistry (journal) , diffraction , electrical resistivity and conductivity , thin film , x ray crystallography , electron diffraction , crystallography , composite material , chemical engineering , nanotechnology , optics , chemistry , physics , chromatography , engineering , electrical engineering
A heterogeneous multilayer system (Co 40 Fe 40 B 20 ) 34 (SiO 2 ) 66 /ZnO was obtained by ion-beam sputtering. X-ray diffraction analysis showed that the obtained films have an amorphous multilayer structure. Transmission electron microscopy analysis (TEM) confirmed the formation of separated (Co 40 Fe 40 B 20 ) 34 (SiO 2 ) 66 and ZnO layers. The (Co 40 Fe 40 B 20 ) 34 (SiO 2 ) 66 composite layers are monogranular with a metal particle size of 1 nm. The thin films remain stable after heat treatment at temperatures up to 350 °C. Measurement of the electrical resistance confirms the formation of a multilayer structure and crystallization of films after heating above 350 °C.