Open AccessAnalysis of Short-circuit and Protection Failure Risk Considering Random Output of Distributed Photovoltaics
Author(s) -
Yao Da,
Huan Zhang,
Wei Deng
Publication year - 2017
Publication title -
iop conference series. earth and environmental science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.179
H-Index - 26
eISSN - 1755-1307
pISSN - 1755-1315
DOI - 10.1088/1755-1315/63/1/012004
Subject(s) - circuit breaker , reliability engineering , sensitivity (control systems) , photovoltaics , distributed generation , margin (machine learning) , fault (geology) , short circuit , computer science , engineering , electronic engineering , photovoltaic system , electrical engineering , voltage , renewable energy , machine learning , seismology , geology