Open AccessEffect of Thickness and Patterns of Graphene Film on High-frequency Power Absorption
Author(s) -
Chung Yen Hsu,
L. S. Chen
Publication year - 2020
Publication title -
iop conference series. earth and environmental science
Language(s) - English
Resource type - Journals
eISSN - 1755-1307
pISSN - 1755-1315
DOI - 10.1088/1755-1315/582/1/012007
Subject(s) - graphene , materials science , microstrip , microwave , epoxy , transmission line , optoelectronics , conductivity , reflection loss , substrate (aquarium) , return loss , absorption (acoustics) , insertion loss , network analyzer (electrical) , composite material , optics , composite number , electronic engineering , telecommunications , nanotechnology , computer science , chemistry , physics , oceanography , engineering , geology , antenna (radio)
In this paper we discuss the effect of thickness and patterns of graphene film on high-frequency noise absorption performance, experimentally determine the graphene film of electromagnetic reflection, absorption loss and transmission. A simple thickness design microstrip line based structure has been used for the microwave characterization in high-frequency. The graphene material mixing with epoxy (graphene : 70wt%, epoxy:30wt%, conductivity approximately 116 Siemens/m) was spin-coated or screen-printed on FR4 substrate to obtain the desired different film thickness. Complex S-parameter measures reveal different on thickness(0.05mm/0.5mm) in comparison to microstrip line. In this paper we found the graphene dual-film fabricated into the stair pattern with a thickness ratio of 1:10 has better performance than single layer. Both the S parameters and absorption power performance (P loss /P in ) were measured in the high frequency range of 0.05 GHz–10 GHz. In this study the experiment results show that dual-film power loss reaches 95% at 2GHz were measured using an Agilent Technologies vector network analyzer PNA-X N5242A OPT200(VNA).