Open AccessResearch on Failure Mechanism of a Digital to Analog Converter Induced by Electrochemical Decay
Author(s) -
Pengfei Lian,
Hui Zhang,
Xixi Wang,
Ying Pan,
Liangliang Yang,
Zebin Kong,
Weiming Zhu,
Jianshe Lou,
Kunshu Wang
Publication year - 2020
Publication title -
iop conference series. earth and environmental science
Language(s) - English
Resource type - Journals
eISSN - 1755-1307
pISSN - 1755-1315
DOI - 10.1088/1755-1315/514/5/052040
Subject(s) - electrochemistry , analog to digital converter , materials science , electric field , digital to analog converter , mechanism (biology) , electrical engineering , physics , electrode , voltage , engineering , quantum mechanics
This paper focus on mechanism of a digital to analog converter induced by electrochemical decay. The electrical parameters and the I/V characteristics of the digital to analog converter are abnormal, and the 11-pin of the device are open because of the decay. By the scanning electron microscope inspection and the energy spectrum analysis to the decay, the carbon and the oxygen of the decay are relatively high, and there exists decaying elements chlorine. The mechanism of the electrochemical decay is analysed, the reason of the electrochemical decay contains three elements: moisture, decaying elements and electric field. Moreover, the 11-pin has the worst decay resulted from the strongest electric field, inducing the opening of 11-pin and the failure of the digital to analog converter.