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Preparation and Optical Properties of TiO2-SiO2 thin films by Sol-gel Dipping Method
Author(s) -
Jun Wang,
Qianwen Ran,
Xunhu Xu,
Binghua Zhu,
Wenjuan Zhang
Publication year - 2019
Publication title -
iop conference series earth and environmental science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.179
H-Index - 26
eISSN - 1755-1307
pISSN - 1755-1315
DOI - 10.1088/1755-1315/310/4/042029
Subject(s) - sol gel , materials science , thin film , microstructure , differential thermal analysis , chemical engineering , diffraction , ultraviolet , analytical chemistry (journal) , composite material , optics , nanotechnology , chemistry , chromatography , optoelectronics , physics , engineering
TiO 2 , SiO 2 and TiO 2 -SiO 2 thin films were prepared by sol-gel dipping method on glass substrates. The pyrolysis behavior of TiO 2 and SiO 2 dry gel were tested by differential thermal analysis (DTA). The microstructure and optical properties of the TiO 2 , SiO 2 and TiO 2 - SiO 2 were studied by X-ray diffraction (XRD) and ultraviolet and visible spectrophotometer. The results showed that the phase structure of the films was affected by the composition. All the films were transparent in the visible region. Meanwhile, the transparency of SiO 2 was better than TiO 2 and TiO 2 -SiO 2 composite film. The ban-gap of the TiO 2 , SiO 2 and TiO 2 -SiO 2 thin films were 3.79, 4.01 and 3.91.

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