Open AccessApplication of X-ray Detection Technology in Routine Tests of High Voltage Bushings and Arresters
Author(s) -
Yonggang Yue,
Haibo Feng,
Youwen Fan,
Yongpeng Zhang,
Ting Lin,
Lanjun Yang
Publication year - 2019
Publication title -
iop conference series. earth and environmental science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.179
H-Index - 26
eISSN - 1755-1307
pISSN - 1755-1315
DOI - 10.1088/1755-1315/237/3/032097
Subject(s) - flange , reliability (semiconductor) , high voltage , bushing , interrupter , electrical engineering , overvoltage , voltage , forensic engineering , engineering , power (physics) , structural engineering , physics , quantum mechanics