Open AccessThe Comprehensive Management System of High Voltage Electrical Test Apparatus
Author(s) -
Yuanming Ma,
Lida Zou,
Yu Ning,
Dali Qi,
Yufeng Chen
Publication year - 2019
Publication title -
iop conference series. earth and environmental science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.179
H-Index - 26
eISSN - 1755-1307
pISSN - 1755-1315
DOI - 10.1088/1755-1315/219/1/012024
Subject(s) - reliability (semiconductor) , test (biology) , computer science , signature (topology) , voltage , focus (optics) , reliability engineering , test data , high voltage , embedded system , simple (philosophy) , automatic test pattern generation , computer hardware , engineering , electrical engineering , electronic circuit , power (physics) , software engineering , paleontology , philosophy , physics , geometry , mathematics , optics , epistemology , quantum mechanics , biology