Characterisation of the performance of p-type Si detectors for hard X-ray spectroscopy
Author(s) -
B. D. Cline,
M. Bullough,
K. Richardson,
H. Thorpe,
Matthew C. Veale,
Matthew D. Wilson
Publication year - 2022
Publication title -
journal of instrumentation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.741
H-Index - 84
ISSN - 1748-0221
DOI - 10.1088/1748-0221/17/05/p05030
Subject(s) - full width at half maximum , application specific integrated circuit , materials science , optoelectronics , resolution (logic) , detector , pixel , x ray detector , physics , spectroscopy , dot pitch , chip , semiconductor , optics , electrical engineering , electronic engineering , computer science , quantum mechanics , artificial intelligence , engineering
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