z-logo
open-access-imgOpen Access
Characterisation of the performance of p-type Si detectors for hard X-ray spectroscopy
Author(s) -
B. D. Cline,
M. Bullough,
K. Richardson,
H. Thorpe,
Matthew C. Veale,
Matthew D. Wilson
Publication year - 2022
Publication title -
journal of instrumentation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.741
H-Index - 84
ISSN - 1748-0221
DOI - 10.1088/1748-0221/17/05/p05030
Subject(s) - full width at half maximum , application specific integrated circuit , materials science , optoelectronics , resolution (logic) , detector , pixel , x ray detector , physics , spectroscopy , dot pitch , chip , semiconductor , optics , electrical engineering , electronic engineering , computer science , quantum mechanics , artificial intelligence , engineering

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom