Open AccessMethod for in situ measuring the thickness of a lithium layer
Author(s) -
Dmitrii Kasatov,
Iaroslav Kolesnikov,
Alexey Koshkarev,
A. N. Makarov,
Evgeniia Sokolova,
Ivan Shchudlo,
Sergey Taskaev
Publication year - 2020
Publication title -
journal of instrumentation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.741
H-Index - 84
ISSN - 1748-0221
DOI - 10.1088/1748-0221/15/10/p10006
Subject(s) - lithium (medication) , layer (electronics) , materials science , boron , in situ , copper , lithium borate , yield (engineering) , substrate (aquarium) , neutron , analytical chemistry (journal) , composite material , nuclear physics , metallurgy , chemistry , physics , medicine , oceanography , organic chemistry , chromatography , borate glass , geology , endocrinology
This work describes a new method for in situ measuring the lithium layer thickness. The method is based on the registration of the yield of 478 keV gamma-quanta of 7 Li(p,p'γ) 7 Li reaction. The results of measuring the radial distribution of the thickness of a lithium layer thermally deposited in vacuum on a cooled copper substrate are presented. The possibility of using this method for certification of lithium targets used for boron neutron capture therapy is noted.