Open AccessMeasuring the distribution of the charge carrier concentration in delta-doped layers based on diamond
Author(s) -
L. M. Shestakova,
В. И. Зубков
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/993/1/012005
Subject(s) - delta , diamond , doping , charge (physics) , materials science , measure (data warehouse) , analytical chemistry (journal) , admittance , crystal (programming language) , charge carrier , layer (electronics) , mineralogy , chemistry , optoelectronics , nanotechnology , physics , composite material , chromatography , data mining , quantum mechanics , astronomy , computer science , programming language , electrical impedance