Open AccessOn the mechanism of thickness dependence of the critical current density in HTS cuprate epitaxial films
Author(s) -
Yu V Cherpak,
V. L. Svetchnikov,
А. Семенов,
V. O. Moskaliuk,
C.G. Tretiatchenko,
V. S. Flis,
V. M. Pan
Publication year - 2008
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/97/1/012259
Subject(s) - cuprate , epitaxy , condensed matter physics , mechanism (biology) , critical current , materials science , current (fluid) , superconductivity , physics , nanotechnology , thermodynamics , quantum mechanics , layer (electronics)