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Verification of the quantum dimension effects in electricsl condactivity with different topology of laser-induced thin-film structures
Author(s) -
С. М. Аракелян,
A. O. Kucherik,
S. Kutrovskaya,
A. Osipov,
A. V. Istratov,
I. O. Skryabin
Publication year - 2018
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/951/1/012018
Subject(s) - jump , photonics , quantum tunnelling , dimension (graph theory) , topology (electrical circuits) , basis (linear algebra) , set (abstract data type) , laser , quantum , stress (linguistics) , materials science , optoelectronics , computer science , physics , quantum mechanics , mathematics , engineering , electrical engineering , pure mathematics , geometry , speech recognition , programming language

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