
Quantitative evaluation of spatial scale of carrier trapping at grain boundary by GHz-microwave dielectric loss spectroscopy
Author(s) -
Wookjin Choi,
Yusuke Tsutsui,
Tomoyo Miyakai,
Tsuneaki Sakurai,
Shu Seki
Publication year - 2017
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/924/1/012002
Subject(s) - pentacene , materials science , grain boundary , grain size , electron mobility , charge carrier , dielectric , organic semiconductor , optoelectronics , dielectric spectroscopy , analytical chemistry (journal) , condensed matter physics , thin film transistor , composite material , electrode , chemistry , layer (electronics) , microstructure , physics , electrochemistry , chromatography