Open AccessThermal imaging of nickel wires with a fluorescent nanoprobe
Author(s) -
Benjamin Samson,
Lionel Aigouy,
Gilles Tessier,
Peter Löw,
B J Kim,
Christian Bergaud,
Michel Mortier
Publication year - 2007
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/92/1/012089
Subject(s) - materials science , scanning thermal microscopy , fluorescence , thermal , nanoprobe , nickel , microscope , fluorescence microscope , resistive touchscreen , rendering (computer graphics) , microscopy , optoelectronics , nanotechnology , optics , atomic force microscopy , nanoparticle , metallurgy , physics , electrical engineering , computer graphics (images) , engineering , meteorology , computer science