Open AccessScanning ion-conductance and atomic force microscope with specialized sphere-shaped nanopippettes
Author(s) -
M. V. Zhukov,
I. D. Sapozhnikov,
A. O. Golubok,
V. I. Chubinskiy-Nadezhdin,
Filipp Komissarenko,
S. Yu. Lukashenko
Publication year - 2017
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/917/4/042022
Subject(s) - scanning electron microscope , scanning ion conductance microscopy , scanning probe microscopy , microscopy , conductance , materials science , microscope , ion current , conductive atomic force microscopy , non contact atomic force microscopy , scanning capacitance microscopy , optical microscope , magnetic force microscope , ion , analytical chemistry (journal) , nanotechnology , optics , atomic force microscopy , scanning confocal electron microscopy , chemistry , physics , condensed matter physics , magnetization , organic chemistry , quantum mechanics , chromatography , magnetic field , composite material