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Development of in situ magneto-ellipsometry for studying correlation between the optical and magneto-optical properties of ferromagnetic thin films
Author(s) -
O. A. Maximova,
Н. Н. Косырев,
С. Н. Варнаков,
S. A. Lyashchenko,
I. ATarasov,
I. AYakovlev,
O. M. Maximova,
Д. В. Шевцов,
С. Г. Овчинников
Publication year - 2017
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/903/1/012060
Subject(s) - ellipsometry , materials science , magneto , in situ , ferromagnetism , magneto optical , thin film , molecular beam epitaxy , nanostructure , dielectric , condensed matter physics , optoelectronics , epitaxy , optics , magnetic field , analytical chemistry (journal) , layer (electronics) , nanotechnology , chemistry , physics , magnet , organic chemistry , quantum mechanics , chromatography

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