Open AccessThe method of measuring the thermoelectric power in the thin films of the semimetals and narrow-gap semiconductors formed on the thin substrates
Author(s) -
Е. В. Демидов,
В. М. Грабов,
В. А. Комаров,
A. V. Suslov,
M. V. Suslov
Publication year - 2017
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/857/1/012006
Subject(s) - semiconductor , materials science , thin film , optoelectronics , semimetal , seebeck coefficient , thermoelectric effect , engineering physics , power (physics) , band gap , nanotechnology , condensed matter physics , composite material , physics , thermal conductivity , quantum mechanics , thermodynamics