
X-ray CTR scattering measurement to investigate the formation process of InP/GaInAs interface
Author(s) -
Masao Tabuchi,
Akiko Mori,
Y. Ohtake,
Yoshikazu Takeda
Publication year - 2007
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/83/1/012031
Subject(s) - interface (matter) , scattering , process (computing) , materials science , x ray , optoelectronics , optics , computer science , physics , composite material , operating system , capillary number , capillary action