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Instrumentation for X-ray reflectivity in micro area: present status and future outlook
Author(s) -
Kazuo Sakurai,
Mari Mizusawa,
Masashi Ishii,
Shunichi Kobayashi,
Yasuhiko Imai
Publication year - 2007
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/83/1/012001
Subject(s) - x ray reflectivity , instrumentation (computer programming) , reflectivity , optics , nanometre , image resolution , resolution (logic) , computer science , materials science , remote sensing , engineering physics , nanotechnology , physics , geology , artificial intelligence , operating system

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