Open AccessSimulation and investigation of SiPM’s leakage currents at low voltages
Author(s) -
P. Parygin,
E. Popova,
В. М. Грачев
Publication year - 2017
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/798/1/012221
Subject(s) - silicon photomultiplier , voltage , technology cad , semiconductor device , leakage (economics) , materials science , electronic engineering , breakdown voltage , biasing , optoelectronics , semiconductor , current (fluid) , computer science , electrical engineering , engineering , cad , nanotechnology , detector , scintillator , layer (electronics) , engineering drawing , economics , macroeconomics