
Measurement of volt-ampere characteristics of the SiPM on wafer level with setup based on the PA200 BlueRay probe station
Author(s) -
E. Popova,
P. Buzhan,
F. Kayumov,
A. Stifutkin
Publication year - 2017
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/798/1/012215
Subject(s) - silicon photomultiplier , wafer , volt , voltage , materials science , electrical engineering , optoelectronics , avalanche breakdown , breakdown voltage , electronic engineering , engineering , detector , scintillator