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Estimation of the sensitivity in dual wave X-ray absorptiometry
Author(s) -
A. S. Gogolev,
R. O. Rezaev,
Yu. M. Cherepennikov,
A. V. Vukolov,
T Gogoleva
Publication year - 2016
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/732/1/012032
Subject(s) - sensitivity (control systems) , dual (grammatical number) , flow (mathematics) , computer science , resolution (logic) , multiphase flow , high resolution , computational physics , physics , mechanics , artificial intelligence , geology , electronic engineering , remote sensing , engineering , art , literature
Dual wave X-ray absorptiometry is considered theoretically and the application of suggested technique extends to the multiphase flow analysis. Proposed method allows for specifying dynamically the percentage of fluid components with the resolution as high as 0.25% (according to the mathematical simulating). The accuracy of this measurement is one order higher by magnitude than that provided by the state of the art flow analyzing devices