Open AccessPrecision optical metrology with alkali-atom isoclinic points
Author(s) -
Nathan P. Wells,
Travis Driskell,
J. C. Camparo
Publication year - 2016
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/723/1/012033
Subject(s) - alkali metal , spectroscopy , metrology , atom (system on chip) , doppler effect , spectral line , absorption spectroscopy , resonance (particle physics) , atomic absorption spectroscopy , absorption (acoustics) , sensitivity (control systems) , resolution (logic) , atomic physics , materials science , chemistry , physics , analytical chemistry (journal) , optics , quantum mechanics , computer science , chromatography , electronic engineering , embedded system , engineering , artificial intelligence