Open AccessSimulation of surface radiation defects leakage current SiPM using Synopsys TCAD
Author(s) -
P. Parygin,
E. Popova,
В. М. Грачев
Publication year - 2016
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/675/4/042046
Subject(s) - silicon photomultiplier , materials science , optoelectronics , technology cad , radiation , breakdown voltage , semiconductor device , silicon , biasing , voltage , electronic engineering , optics , electrical engineering , nanotechnology , physics , engineering , detector , cad , scintillator , layer (electronics) , engineering drawing