
Study of mechanically stimulated ferroelectric domain formation using scanning probe microscope
Author(s) -
J H Kim,
Jong Hyeob Baek,
Z. G. Khim
Publication year - 2007
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/61/1/109
Subject(s) - materials science , ferroelectricity , microscope , domain (mathematical analysis) , scanning probe microscopy , scanning electron microscope , nanotechnology , optoelectronics , composite material , optics , physics , dielectric , mathematical analysis , mathematics