
System for measuring the spatial reflectance distribution of material surfaces
Author(s) -
L. A. Berni,
Martha S. Ribeiro,
Tiago Franca Paes,
A.F. Beloto
Publication year - 2015
Publication title -
journal of physics. conference series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/605/1/012003
Subject(s) - optics , materials science , azimuth , stepper , zenith , angular resolution (graph drawing) , aluminium , silicon , anodizing , reflectivity , optoelectronics , physics , composite material , mathematics , combinatorics