Open AccessSub-micrometer transverse beam size diagnostics using optical transition radiation
Author(s) -
Konstantin Kruchinin,
Alexander Aryshev,
P. Karataev,
B. Bolzon,
T. Lefèvre,
Stefano Mazzoni,
M. Shevelev,
Stewart Boogert,
Laurence Nevay,
N. Terunuma,
J. Urakawa
Publication year - 2014
Publication title -
journal of physics. conference series
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.21
H-Index - 85
eISSN - 1742-6596
pISSN - 1742-6588
DOI - 10.1088/1742-6596/517/1/012011
Subject(s) - optics , transition radiation , beam (structure) , micrometer , diffraction , optical radiation , radiation , chromatic aberration , physics , resolution (logic) , chromatic scale , materials science , computer science , artificial intelligence